CS302 GDB
 Idea solution
Integrated circuits are more and more present in our life. From personal computers to smart-phones, or hidden electronics in cars, we are all using integrated circuits in our daily life. There are infinite examples. As layout minimum feature sizes shrink, more elements can be integrated in a sing
le chip allowing new applications and capabilities. However, this is a challenging trend that requires enormous efforts from the semiconductor industry including manufacturers, designers and electronic design automation (EDA) developers.
As society adapts to the nano and bio world, and we integrate these technologies into more complex systems, it becomes ever more important to hold products accountable, and to require better quality and reliability from them. To cope with this challenge, modern statisticians and reliability engineers need to re-engineer themselves to learn about the nano world. In order not to be left behind the modern society in terms of technology advancement, researchers must become less bogged down in the old, purely academic exercise of separating hypothetical problems from real world problems, and applying only mathematically rigorous approaches.
There appear to be four major challenges related to nano electronics that currently face the field of reliability: identification of the failure mechanisms, enhancement of the low yields of nano products, management of the scarcity and secrecy of the available data, and preparation of reliability practitioners and researchers for keeping up with the nano era.

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